Synthesis & Characterization of PCT (76/24) Thin Films

Abstract

The thin films of calcium substituted PbTiO3 system were prepared by spin coating technique at different temperatures namely at 5500C, 6000C and 6500C, respectively. The phase formation and structural property of all thin films were studied by X-Ray Diffraction (XRD) technique.
• The XRD pattern of PCT thin films indicated the formation of single perovskite phase at 5500C annealing temperature.
• The surface morphology of the annealed thin films was studied by SEM which showed dense and homogeneous packing of grain with grain size ~1.25µm.
• Temperature and frequency dependence of dielectric behavior of PCT thin films have been studied.
• Thickness of the PCT thin film was measured and found to be ~100nm.