Synthesis and characterization of YBCO Thick Films

Abstract

Thick films of (1-x) YBCO + x Y2O3 (x= 0, 5, 10, 15, 20 wt. %) composites are prepared using diffusion reaction. Microstructural analysis is performed using SEM, and phase conformation of YBCO composite is done by X-ray diffraction method. Data collected are computer controlled through automated programs. XRD of pristine YBCO has orthorhombic phase at room temperature with space group Pmmm, but with the increase in the concentration of Y2O3, impurity peaks were observed. The resistivity vs. temperature was done by four probe method. It is found that by increasing the wt. % of Y2O3 in YBCO matrix, transition temperature (Tc) gradually decreases, and for very high concentration, a semiconducting trend was observed with a drop in resistivity.