Recrystallization Texture development in CP-Titanium

Abstract

Understanding of recrystallization texture, the objective of the present study, is very
important because most of the engineering components subjected to annealing as a final
forming operation before different applications. Such recrystallization texture is well
established in cubic materials compared to hexagonal materials. In the present study
recrystallization texture development in CP-titanium was investigated. CP-titanium grade-2
plates were subjected to cold rolling of 90% reduction in thickness. The rolled plates were
annealed at 700oC for 5hrs. Such annealed plates were then subjected to accumulative roll
bonding (ARB) for 6 passes. The ARB processed samples were then subjected to isochronal
annealing at 200oC, 300oC, 400oC, 500oC and 600oC for 1hr to obtain the recrystallization
temperature. Final annealing of the ARB processed samples was carried out at 600oC for
different soaking time: 5sec, 10sec, 20sec, 30sec, 60sec, 120sec, 300sec, 600sec, 1200sec,
1800sec and 3600secr, to establish the texture development during annealing. The annealed
samples were subsequently characterized under XRD (X-ray Diffraction) for bulk texture
measurement and EBSD (Electron backscattered diffraction) for micro-texture and
microstructural developments. Strengthening of (11-24)<31-4-1> orientation with increasing
annealing time was observed.