RTL Design Quality Checks for Soft IPs

Patra, Smrutisikta (2016) RTL Design Quality Checks for Soft IPs. MTech thesis.

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Abstract

Soft IPs are architectural modules which are delivered in the form of synthesizable RTL level codes written in some HDL (hardware descriptive language) like Verilog or VHDL or System Verilog. They are technology independent and offer high degree of modification flexibility. RTL is the complete abstraction of our design. Since SOC complexity is growing day by day with new technologies and requirement, it will be very much difficult to debug and fix issues after physical level. So to reduce effort and increase efficiency and accuracy it is necessary to fix most of the bugs in RTL level. Also if we are using soft IP, then our bug free IP can be used by third party. So early detection of bugs helps us not to go back to entire design and do all the process again and again. One of the important issue at RTL level of a design is the Clock Domain Crossing (CDC) problem. This is the issue which affects the performance at each and every stage of the design flow. Failure in fixing these issues at the earlier stage makes the design unreliable and design performance collapses. The main issue in real time clock designs are the metastability issue. Although we cannot check or see these issues using our simulator but we have to make preventions at RTL level. This is done by restructuring the design and adding required synchronizers. One more important area of consideration in VLSI design is power consumption. In modern low power designs low power is a key factor. So design consuming less power is preferred over design consuming more power. This decision should be made as early as possible. RTL quality check helps us on this aspect. Using different tools power estimation can be performed at RTL stage which saves lots of efforts in redesigning. This project aims at checking clock domain crossing faults at RTL stage and doing redesign of circuit to eliminate those faults. Also an effort is made to compare quality of two designs in terms of delay, power consumption and area.

Item Type:Thesis (MTech)
Uncontrolled Keywords:RTL; CDC; Metastability; Incoherancy; Synchronizer; MCP; FIFO
Subjects:Engineering and Technology > Electronics and Communication Engineering > VLSI
Divisions: Engineering and Technology > Department of Electronics and Communication Engineering
ID Code:8598
Deposited By:Mr. Sanat Kumar Behera
Deposited On:20 Aug 2017 15:05
Last Modified:20 Aug 2017 15:05
Supervisor(s):Kar, K R

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